Microchip 11AA02E48 Manual

Microchip Ikke kategoriseret 11AA02E48

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Side 1/6

AN1019

BASIC TERMS

The definition of “endurance” (as applied to EEPROMs)

contains various words and phrases that require clear

definition and understanding. As shown in the following

paragraphs, different manufacturers use different

standards. “Endurance cycling” is a test performed by

all manufacturers (and some customers) to determine

how many “write cycles” the product will achieve before

failing.

Microchip defines “endurance” as the minimum

number of write cycles the product can be subjected to

before it fails.

“Failure” is a somewhat arbitrary definition since a

device only truly fails when it no longer meets the

customer expectation and does not operate in his

system. A failure can be defined in this, the loosest of

definitions, or the most stringent of definitions (whereby

a device would fail if it did not meet any of the data

sheet parameters), as well as a wide range in between.

For example, if the device does not correctly store data

into a particular address that is not used, then the

device would work correctly for the customer but would

fail a functional test by the manufacturer. Likewise, if

the device draws more current than the data sheet

specifies after some time, but the customer application

could supply the current needed, the device would

work in the customer application but would fail a

parametric test set by the manufacturer.

Microchip uses the most stringent definition:

A failure occurs when the device fails to meet any

data sheet condition under any specified operating

condition of a temperature and voltage.

The number of devices that can fail before a particular

endurance criteria is not met is also somewhat flexible.

Even the most quality-conscious manufacturer will

occasionally have a failure, so a failure level is defined.

There are several industry standard conditions for

many types of reliability tests. For example, IEEE-Std-

1005-1998 defines a maximum cumulative failure rate

of 1%. JEDEC (The Joint Electronic Device Engineer-

ing Council), JESD47, defines that if three lots of 77

units each have no fails (equivalent to an LTPD of 1%)

at a given endurance goal, then that goal has been

met.

Microchip uses a more stringent criteria for endurance:

No fails out of a sample of 256 units per product, and

no fails out of 3 lots of 256 units each per technology

for the given endurance goal to have been met. That is

equivalent to 0/768 or less than 0.3% LTPD.

A “write cycle” is also a somewhat flexible definition

since almost every customer will write the device in a

different way. For example, if the customer application

uses only the first three bytes of the array to store

variable data, and the remainder of the array is used as

a look-up table, then a write cycle will be complete

when the three data bytes have been re-written to their

new data state.

A write cycle is often described as an erase/write cycle

since almost all EEPROM technologies employ an

“auto-erase” before the data is actually written to the

array. This is also used by Microchip but we will use the

term “write cycle” since the auto-erase is invisible to,

and cannot be suppressed by, the customer.

The term “data changes” is occasionally used in place

of “write cycle” or “erase/write cycle.” A data change

will occur when an auto-erase cycle is initiated, and a

second data change will occur upon the write cycle,

therefore, an “erase/write cycle” is equivalent to two

“data changes.” The term “data change” may also imply

that a different type of cycling is being used than

“erase/write cycle”. This will be described later.

The term “write cycle” does not define under what

conditions the cycling was done (unless explicitly

stated), nor does it define the type of cycling that was

done. The endurance cycling can be done at any

number of conditions of voltage and temperature (e.g.,

85°C and 5.5V, or 25°C and 5.0V) that may or may not

meet with a customer’s application. The cycling mode

used in endurance cycling can affect the endurance of

the product. All these effects will be described later.

Microchip uses the most stringent conditions that are

reasonable for endurance cycling: Byte or Page mode

cycling at a temperature or 85°C at 5.5V. All data not

explicitly defined at other conditions is taken at these

conditions.

SYSTEM DESIGN CONSIDERATIONS

There are a number of design considerations that the

system designer can use to maximize the endurance of

an EEPROM-based device, if endurance is the

application’s limiting factor.

Author: David Wilkie

Microchip Technology Inc.

EEPROM Endurance Tutorial

Produkt Specifikationer

Mærke:	Microchip
Kategori:	Ikke kategoriseret
Model:	11AA02E48

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